DocumentCode :
10928
Title :
Statistical Framework for Designing On-Chip Thermal Sensing Infrastructure in Nanoscale Systems
Author :
Yufu Zhang ; Bing Shi ; Srivastava, Anurag
Author_Institution :
Univ. of Maryland, College Park, MD, USA
Volume :
22
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
270
Lastpage :
279
Abstract :
Thermal/power issues have become increasingly important with more and more transistors being placed on a single chip. Many dynamic thermal/power management techniques have been proposed to address such issues but they all depend heavily on accurate knowledge of the chip´s thermal state during runtime. In this paper, we describe a unified statistical framework for designing an on-chip thermal sensing infrastructure that can be used to track the chip´s thermal state at runtime. Specifically, we address the following problems in this statistical framework: 1) sensor placement; 2) sensor data compression; 3) sensor data fusion; and 4) overall interplay. Our methods exploit the correlations between temperatures in different parts of the chip to drive sensor placement, data compression, and data fusion in both noiseless and noisy sensor cases. Our framework is also capable of choosing the appropriate degree of compression for each sensor while accounting for their local space constraints during deployment. The experimental results show that the root-mean-square error of the thermal estimates produced by our sensing infrastructure is on average 35% better than an equivalent system that uses a range-based placement scheme and a uniform compression scheme. It took our methods at most about 9 s to decide the overall solution for placement, compression, and data fusion at the design stage. This demonstrates the effectiveness and applicability of our unified statistical design methodology.
Keywords :
mean square error methods; statistical analysis; thermal management (packaging); dynamic thermal/power management techniques; nanoscale systems; on-chip thermal sensing infrastructure; range-based placement scheme; root-mean-square error; sensor data compression; sensor data fusion; sensor placement; thermal state; transistors; unified statistical design methodology; unified statistical framework; Data compression; sensor placement; statistical design; temperature estimation; thermal design;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2244926
Filename :
6494677
Link To Document :
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