DocumentCode
1092976
Title
Band-to-band auger effect in long wavelength multinary III-V alloy semiconductor lasers
Author
Sugimura, Akira
Author_Institution
Musashino Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation, Musashino-shi, Tokyo, Japan
Volume
18
Issue
3
fYear
1982
fDate
3/1/1982 12:00:00 AM
Firstpage
352
Lastpage
363
Abstract
Band-to-band Auger effects and radiative recombination rates are theoretically compared for long wavelength multinary III-V compound semiconductor lasers. Stern\´s band model and matrix element are used for the calculation of gain coefficient and radiative recombination rate. Overlap integrals for Auger processes are obtained by a
perturbation method. Approximate statistical weight function is used, which includes the weakly degenerate effect. It is found that the Auger effect involving excited split-off band (CHSH process) is dominant when bandgap Eg is greater than split-off gap Δ, while the Auger effect involving excited conduction band (CHCC process) predominates over others when
. When Eg is comparable to or slightly larger than Δ, the total Auger effect is weak and the quantum efficiency is recovered. This explains the experimentally reported low threshold current in AlGaAsSb and GaInAsSb lasers at about 1.8 μm. In all the possible III-V lasers, the quantum efficiency is reduced to less than 5 percent for wavelengths
m at room temperature and for
m at 77 K, respectively. The calculated values of Auger currents include an error of factor two or three, mainly caused by the ambiguity in band parameters.
perturbation method. Approximate statistical weight function is used, which includes the weakly degenerate effect. It is found that the Auger effect involving excited split-off band (CHSH process) is dominant when bandgap E
. When E
m at room temperature and for
m at 77 K, respectively. The calculated values of Auger currents include an error of factor two or three, mainly caused by the ambiguity in band parameters.Keywords
Bibliographies; Gallium materials/lasers; Charge carrier density; III-V semiconductor materials; Laser excitation; Laser modes; Laser theory; Perturbation methods; Photonic band gap; Radiative recombination; Semiconductor lasers; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1982.1071543
Filename
1071543
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