DocumentCode :
1093026
Title :
A 64-bit carry look ahead adder using pass transistor BiCMOS gates
Author :
Ueda, Kimio ; Suzuki, Hiroaki ; Suda, Kakutaro ; Shinohara, Hirofumi ; Mashiko, Koichiro
Author_Institution :
LSI Res. & Dev. Lab., Mitsubishi Electr. Corp., Hyogo, Japan
Volume :
31
Issue :
6
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
810
Lastpage :
818
Abstract :
This paper describes a 64-bit two-stage carry look ahead adder utilizing pass transistor BiCMOS gate. The new pass transistor BiCMOS gate has a smaller intrinsic delay time than conventional BiCMOS gates. Furthermore, this gate has a rail-to-rail output voltage. Therefore the next gate does not have a large degradation of its driving capability. The exclusive OR and NOR gate using the pass transistor BiCMOS gate shows a speed advantage over CMOS gates under a wide variance in load capacitance. The pass transistor BiCMOS gates were applied to full adders, carry path circuits, and carry select circuits. In consequence, a 64-bit two-stage carry look ahead adder was fabricated using a 0.5 μm BiCMOS process with single polysilicon and double-metal interconnections. A critical path delay time of 3.5 ns was observed at a supply voltage of 3.3 V. This is 25% better than the result of the adder circuit using CMOS technology. Even at the supply voltage of 2.0 V, this adder is faster than the CMOS adder
Keywords :
BiCMOS digital integrated circuits; BiCMOS logic circuits; VLSI; adders; carry logic; delays; logic gates; 0.5 micron; 3.3 V; 3.5 ns; 64 bit; carry look ahead adder; carry path circuits; carry select circuits; critical path delay time; double-metal interconnections; driving capability; full adders; intrinsic delay time; load capacitance; pass transistor BiCMOS gates; rail-to-rail output voltage; single polysilicon; Adders; BiCMOS integrated circuits; CMOS technology; Degradation; Delay effects; Inverters; Parasitic capacitance; Rail to rail outputs; Virtual manufacturing; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.509867
Filename :
509867
Link To Document :
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