• DocumentCode
    109323
  • Title

    Theoretical Investigation of Trigate AlGaN/GaN HEMTs

  • Author

    Alsharef, Mohamed Alzarouk ; Granzner, Ralf ; Schwierz, Frank

  • Author_Institution
    Fachgebiet Festkorperelektronik, Tech. Univ. Ilmenau, Ilmenau, Germany
  • Volume
    60
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3335
  • Lastpage
    3341
  • Abstract
    The operation of AlGaN/GaN trigate high-electron mobility transistor (HEMT) structures is investigated by numerical simulations. It is shown that the threshold voltage of such structures strongly depends on the width of the AlGaN/GaN bodies and that solely by decreasing the body width a transition from normally-on to normally-off operation can be achieved. Furthermore, the impact of uncertain device and/or material parameters such as strain relaxation, Schottky barrier heights, and dielectric constants on the threshold voltage is studied as well as the influence of the AlGaN barrier design (Al content, thickness). The results of this paper show that the trigate concept is a viable option to realize normally-off AlGaN/GaN HEMTs.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; numerical analysis; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; Schottky barrier heights; barrier design; dielectric constants; material parameters; numerical simulations; strain relaxation; threshold voltage; trigate HEMT structure; trigate high-electron mobility transistor structure; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Strain; Threshold voltage; AlGaN/GaN high-electron mobility transistor (HEMT); device simulation; normally-off;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2279264
  • Filename
    6588878