• DocumentCode
    1093642
  • Title

    A new VLSI memory cell using capacitance coupling (CC cell)

  • Author

    Terada, Kazuo ; Ishijima, Toshiyuki ; Kurosawa, Susumu ; Suzuk, Shun Ichi

  • Author_Institution
    NEC Corporation, Kawasaki, Japan
  • Volume
    31
  • Issue
    9
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    1319
  • Lastpage
    1324
  • Abstract
    A new VLSI memory cell is proposed, which offers a small cell area, about 6F2(F is the feature size), readout signal gain, and high alpha-particle immunity. Since it employs capacitance coupling in a write operation, it requires only one bit line and is called a capacitance coupling (CC) cell. A CC cell consists of three transistors and a capacitor, which are integrated in a small area by sharing their nodes with one another. The charge is stored in a high-concentration p-type diffused layer (p+-layer) in a shallow n-type diffused layer (n-layer). The p+-layer potential controls the readout current which flows through the n-layer. To obtain both the p+-Iayer isolation and the large readout signal, trench isolation was employed. Experimental test devices having 0.7-µm deep n-layer, 0.2-µm deep p+-layer, and 1.5-µm deep trench isolation region were fabricated. They showed complete CC cell operation and "0"/"1" readout current ratio of more than 10.
  • Keywords
    Coupling circuits; Electrodes; MOSFET circuits; Microelectronics; National electric code; Parasitic capacitance; Testing; Very large scale integration; Voltage control; Writing;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21706
  • Filename
    1483991