DocumentCode
1093768
Title
The Upper Limit of the Cutoff Frequency in Ultrashort Gate-Length InGaAs/InAlAs HEMTs: A New Definition of Effective Gate Length
Author
Akis, Richard ; Ayubi-Moak, Jason S. ; Faralli, Nicolas ; Ferry, David K. ; Goodnick, Stephen M. ; Saraniti, Marco
Author_Institution
Arizona State Univ., Tempe
Volume
29
Issue
4
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
306
Lastpage
308
Abstract
Ultrashort gate-length pseudomorphic high-electron mobility transistors have been modeled using a full-band cellular Monte Carlo simulator. The RF response and the cutoff frequency fT have been obtained for physical gate lengths ranging from 10 to 50 nm. These results, in turn, have been used in a transit-time analysis to determine the effective gate length in each case. By interpolation, one can make an estimate of the absolute upper limit for fT, which we find to be 2.9 THz in the device studied. Importantly, the effective gate lengths are considerably shorter than the depletion lengths. Thus, in general, any estimate of fT based on the latter quantity is likely too small by a quite significant amount.
Keywords
Monte Carlo methods; high electron mobility transistors; simulation; transit time devices; cellular Monte Carlo simulator; cutoff frequency; gate length; high-electron mobility transistors; transit-time analysis; Effective gate length; Monte Carlo methods; millimeter-wave transistors; pseudomorphic high-electron mobility transistors (PHEMTs);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.918391
Filename
4464119
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