Title : 
An analytic study of (GaAl)As gain guided lasers at threshold
         
        
            Author : 
Streifer, William ; Burnham, Robert D. ; Scifres, Don R.
         
        
            Author_Institution : 
Xerox Palo Alto Research Center, Palo Alto, CA, USA
         
        
        
        
        
            fDate : 
5/1/1982 12:00:00 AM
         
        
        
        
            Abstract : 
An analysis of gain-guided diode lasers at threshold is presented. After describing the formulation, the effects of charge induced real refractive index antiguiding and gain-charge density relations are studied in detail. Their influence on the threshold current, modal distributions, and the lateral fax-field radiation patterns is discussed. Next a "model" laser is defined and each parameter including dimensions, compositions, stripewidth, diffusion constants, current spreading resistance, and facet reflectivities is individually varied to determine the resulting modifications in laser properties.
         
        
            Keywords : 
Gallium materials/lasers; Diode lasers; Laser modes; Optical devices; Optical losses; Optical propagation; Optical refraction; Optical variables control; Reflectivity; Refractive index; Threshold current;
         
        
        
            Journal_Title : 
Quantum Electronics, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JQE.1982.1071627