• DocumentCode
    1094029
  • Title

    A novel scheme to measure the interface trap density near band edges using CCD´s

  • Author

    Madan, Sudhir K. ; Bhaumik, Basabi

  • Author_Institution
    MIT, Cambridge, MA
  • Volume
    31
  • Issue
    10
  • fYear
    1984
  • fDate
    10/1/1984 12:00:00 AM
  • Firstpage
    1509
  • Lastpage
    1511
  • Abstract
    A new CCD-based technique to measure the interface trap density is proposed in this paper and the measured values agree with those obtained from the periodic pulse technique. The proposed technique has an operational advantage of measuring the interface state density near the band edge while operating the CCD at any convenient low frequency.
  • Keywords
    Circuit noise; Circuit simulation; Density measurement; Electron devices; Integrated circuit interconnections; Integrated circuit noise; Optical noise; Pulse measurements; Resistors; Semiconductor device noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21742
  • Filename
    1484027
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1094029