Title :
A Production IR-Drop Screen on a Chip
Author :
Abuhamdeh, Zahi ; Hannagan, Bob ; Remmers, Jeff ; Crouch, Alfred L.
Author_Institution :
TranSwitch, Bedford
Abstract :
Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.
Keywords :
failure analysis; integrated circuit measurement; logic design; process monitoring; system-on-chip; on-chip process-monitoring circuit; power failures; production IR-drop screen; Energy consumption; Logic testing; Power distribution; Power grids; Power measurement; Power supplies; Production; Rails; Semiconductor device measurement; Voltage; IR drop; power rails; power-related failures; production screen; screen on a chip;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.59
