DocumentCode
1094102
Title
A Production IR-Drop Screen on a Chip
Author
Abuhamdeh, Zahi ; Hannagan, Bob ; Remmers, Jeff ; Crouch, Alfred L.
Author_Institution
TranSwitch, Bedford
Volume
24
Issue
3
fYear
2007
Firstpage
216
Lastpage
224
Abstract
Many modern designs have large, localized failures due to excessive power consumption, which can be measured as IR drop. The methodology described here employs an on-chip process-monitoring circuit that is easy to integrate on chip and use in a characterization or production environment, to help identify and localize IR-drop hot spots and power-related failures.
Keywords
failure analysis; integrated circuit measurement; logic design; process monitoring; system-on-chip; on-chip process-monitoring circuit; power failures; production IR-drop screen; Energy consumption; Logic testing; Power distribution; Power grids; Power measurement; Power supplies; Production; Rails; Semiconductor device measurement; Voltage; IR drop; power rails; power-related failures; production screen; screen on a chip;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.59
Filename
4288263
Link To Document