Title :
Modeling Power Supply Noise in Delay Testing
Author :
Jing Wang ; Walker, D.M. ; Xiang Lu ; Majhi, A. ; Kruseman, B. ; Gronthoud, G. ; Villagra, L.E. ; van de Wiel, P.J.A. ; Eichenberger, S.
Author_Institution :
Texas A&M Univ., College Station
Abstract :
Excessive power supply noise during test can cause overkill. This article discusses two models for supply noise in delay testing and their application to test compaction. The proposed noise models avoid complicated power network analysis, making them much faster than existing power noise analysis tools. can cause performance degradation and
Keywords :
delays; electronic equipment testing; power electronics; power engineering computing; power supply quality; delay testing; excessive power supply noise; power network analysis; power noise analysis; power supply noise modeling; test compaction; CMOS technology; Circuit noise; Circuit testing; Compaction; Delay; Noise generators; Noise reduction; Power supplies; Semiconductor device noise; Voltage; compaction; delay test; filling; power supply noise model;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.76
