Title :
Power Grid Physics and Implications for CAD
Author :
Pant, Sanjay ; Chiprout, Eli ; Blaauw, David
Author_Institution :
Michigan Univ., Ann Arbor
Abstract :
This article describes a full-die dynamic model of an Intel Pentium IV microprocessor design. The authors show that transient supply noise is sensitive to nonuniform decoupling-capacitor distribution, and that supply-drop locality is a tight function of frequency and package-die resonance, leading to significant localized resonant effects.
Keywords :
CAD; distribution networks; grid computing; power consumption; power engineering computing; power system transients; CAD; Intel Pentium IV microprocessor design; frequency resonance; full-die dynamic model; nonuniform decoupling-capacitor distribution; package-die resonance; power grid physics; transient supply noise; Analytical models; Capacitors; Computational modeling; Inductance; Microprocessors; Packaging; Physics; Power grids; Power supplies; Resonance; L(di/dt); R; decap; locality; power supply networks; resonance;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.78
