• DocumentCode
    1094272
  • Title

    Recording Physics, Design Considerations, and Fabrication of Nanoscale Bit-Patterned Media

  • Author

    Litvinov, Dmitri ; Parekh, Vishal ; E, Chunsheng ; Smith, Darren ; Rantschler, James Owen ; Ruchhoeft, Paul ; Weller, Dieter ; Khizroev, Sakhrat

  • Author_Institution
    Center for Nanomagnetic Syst., Univ. of Houston, Houston, TX
  • Volume
    7
  • Issue
    4
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    463
  • Lastpage
    476
  • Abstract
    Recording physics, design considerations, and fabrication of bit-patterned magnetic medium for next generation data storage systems is presented. (Co/Pd)N magnetic multilayers are evaluated as candidates for bit-patterned medium recording layer materials for their high and easily tunable magnetic anisotropy. The optimized patterned multilayers used in this study had coercivities in excess of 12-14 kOe. Bit patterning was accomplished using ion-beam proximity printing, a high-throughput direct write lithography where a large array of ion beamlets shaped by a stencil mask is used to write an arbitrary device pattern. It is found that the nature of magnetization reversal strongly depends on bit edge imperfections and is likely to contribute to switching field distribution.
  • Keywords
    cobalt; coercive force; ferromagnetic materials; magnetic anisotropy; magnetic multilayers; magnetic recording; magnetic switching; magnetisation reversal; nanolithography; palladium; proximity effect (lithography); Co-Pd; bit edge imperfections; coercivities; data storage; direct write lithography; ion-beam proximity printing; magnetic multilayers; magnetization reversal; nanoscale bit-patterned media; recording physics; stencil mask; switching field distribution; tunable magnetic anisotropy; Magnetic data storage; magnetic data storage; nanomagnetic arrays; patterned medium; recording physics;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.920183
  • Filename
    4468040