Title :
The case for power with test
Author_Institution :
Intel
Abstract :
In the past few years, many researchers have claimed that power issues in test applications are primarily due to scan shifting. The author of this column explains why this conclusion is simply not realistic.
Keywords :
Automatic test pattern generation; Circuit testing; Clocks; Delay; Energy consumption; Energy management; Frequency; Logic; Power grids; Sequential analysis; functional and scan shift speed; power; scan shifting; static and dynamic power; test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.87
