Title :
A 16-bit 65-MS/s Pipeline ADC With 80-dBFS SNR Using Analog Auto-Calibration in SiGe SOI Complementary BiCMOS
Author :
Zanchi, Alfio ; Chang, Dong-Young
Author_Institution :
Linear Technol. Corp., Colorado Springs, CO
Abstract :
A 16-bit 65-MS/s switched-capacitors pipeline analog-to-digital converter built in 0.45-mum 25-GHz fT complementary silicon-on-insulator BiCMOS delivers 80.1-dBFS signal-to-noise ratio, 98-dBc spurious-free dynamic range (SFDR) with 3-Vpp input range at 2-MHz input frequency. The 5 times 5.3 mm2 die consumes 1.7 W from a dual plusmn2.7-V supply. A noniterative analog auto-calibration algorithm simultaneously compensates for both random mismatch in the capacitors of the first quantizer stages, and integral nonlinearity curvatures contributed by sample-and-hold (S/H) and voltage reference buffers, yielding SFDR optimizations up to 12 dB. The test chip performance validates the transient noise simulations run for the analog front-end and the clock jitter, corroborating the efficacy of the circuit techniques adopted to design S/H, clock and references.
Keywords :
BiCMOS integrated circuits; MMIC; analogue-digital conversion; capacitors; silicon-on-insulator; SOI complementary BiCMOS; analog-to-digital converter; clock jitter; frequency 2 MHz; frequency 25 GHz; input frequency; integral nonlinearity curvatures; noniterative analog auto-calibration algorithm; pipeline ADC; power 1.7 W; signal-to-noise ratio; silicon-on-insulator; size 0.45 mum; spurious-free dynamic range; switched-capacitors pipeline; transient noise simulations; voltage -2.7 V; voltage 2.7 V; voltage 3 V; voltage reference buffers; A-to-D Converters; Analog-to-digital converters (ADCs); BiCMOS; INL; SOI; Silicon-Germanium; bootstrap; integral nonlinearity (INL); pipeline architecture; self-calibration; silicon-germanium BiCMOS; silicon-on-insulator (SOI); voltage references;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2008.920123