• DocumentCode
    1094620
  • Title

    Areal inhomogeneities in MIS solar cells

  • Author

    Roenker, Kenneth P.

  • Author_Institution
    University of Cincinnati, Cincinnati, OH
  • Volume
    31
  • Issue
    12
  • fYear
    1984
  • fDate
    12/1/1984 12:00:00 AM
  • Firstpage
    1838
  • Lastpage
    1844
  • Abstract
    The effects of the areal inhomogeneities, particularily oxide thickness variations, on minMIS solar cell performance are examined using an equivalent circuit approach. The presence of thinner regions in an oxide of optimum thickness leads to a reduction in the open-circuit voltage and efficiency and an increase in the dark current. Cells with an excessively thick oxide inhibit tunneling, but with sufficient thin oxide portions can exhibit acceptable performance though control of the thin oxide area is likely to be difficult. For such cells too small a fraction of the cell area of the thin oxide results in reduction in Jsc, FF, and η; too large a thin oxide area can result in VOCreduction if the regions are Schottky-like. The results clarify observed degradations in actual MIS solar cells.
  • Keywords
    Costs; Degradation; Fabrication; Ice thickness; P-n junctions; Photovoltaic cells; Reproducibility of results; Silicon; Substrates; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21798
  • Filename
    1484083