DocumentCode
1094620
Title
Areal inhomogeneities in MIS solar cells
Author
Roenker, Kenneth P.
Author_Institution
University of Cincinnati, Cincinnati, OH
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1838
Lastpage
1844
Abstract
The effects of the areal inhomogeneities, particularily oxide thickness variations, on minMIS solar cell performance are examined using an equivalent circuit approach. The presence of thinner regions in an oxide of optimum thickness leads to a reduction in the open-circuit voltage and efficiency and an increase in the dark current. Cells with an excessively thick oxide inhibit tunneling, but with sufficient thin oxide portions can exhibit acceptable performance though control of the thin oxide area is likely to be difficult. For such cells too small a fraction of the cell area of the thin oxide results in reduction in Jsc , FF, and η; too large a thin oxide area can result in VOC reduction if the regions are Schottky-like. The results clarify observed degradations in actual MIS solar cells.
Keywords
Costs; Degradation; Fabrication; Ice thickness; P-n junctions; Photovoltaic cells; Reproducibility of results; Silicon; Substrates; Thickness measurement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21798
Filename
1484083
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