Structured Design for Testability in Semicustom VLSI
Author :
Aylor, James H. ; Johnson, Barry W. ; Rector, Bruce J.
Author_Institution :
University of Virginia
Volume :
6
Issue :
1
fYear :
1986
Firstpage :
51
Lastpage :
58
Keywords :
Circuit faults; Circuit testing; Design for testability; Integrated circuit technology; Large scale integration; Manufacturing; Sequential analysis; Very large scale integration;
