• DocumentCode
    1094766
  • Title

    Characterization of hygroscopic swelling behavior of mold compounds and plastic packages

  • Author

    Stellrecht, Eric ; Han, Bongtae ; Pecht, Michael G.

  • Author_Institution
    Mech. Eng. Dept., DRS Electron. Warfare & Network Syst. Inc., Buffalo, NY, USA
  • Volume
    27
  • Issue
    3
  • fYear
    2004
  • Firstpage
    499
  • Lastpage
    506
  • Abstract
    Hygroscopic swelling behavior of mold compounds is analyzed by a novel experimental procedure using a whole-field displacement technique. Large variation in moisture content at the virtual equilibrium state is observed, while the coefficient of hygroscopic swelling is shown to not vary significantly. An investigation on an actual package is also performed to determine the hygroscopic swelling mismatch strains at the chip/mold compound interface. The results are compared with the thermal expansion mismatch strains at the same interface and reveal much higher hygroscopic swelling mismatch strains. The hygroscopic strains must be considered for reliability assessment when a package is subjected to environments where the relative humidity fluctuates.
  • Keywords
    atmospheric humidity; chip scale packaging; encapsulation; integrated circuit reliability; swelling; thermal expansion; chip-mold compound interface; experimental procedure; hygroscopic strains; hygroscopic swelling behavior; moisture content; mold compounds; plastic encapsulated microcircuit; plastic packages; relative humidity; reliability assessment; thermal expansion mismatch strains; virtual equilibrium state; whole-field displacement technique; Capacitive sensors; Displacement measurement; Electronic packaging thermal management; Humidity; Hydrogen; Interferometry; Moisture; Plastic packaging; Polymers; Stress; Chip/mold compound interface; PEM; humidity; hygroscopic swelling behavior; mold compounds; plastic encapsulated microcircuit;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.831777
  • Filename
    1331545