Title :
Output structure for buried-channel CCD
Author :
Schlig, Eugene S. ; Chamberlain, Savvas G.
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
fDate :
12/1/1984 12:00:00 AM
Abstract :
An output structure for buried-channel charge coupled devices (CCD) is presented which permits output voltage swings of several volts without restricting the design of the buried-channel or requiring excessive drain voltage. Its application to experimental CCD imaging devices is discussed.
Keywords :
Capacitance; Charge coupled devices; Charge-coupled image sensors; Clocks; Delay lines; Frequency; Optical imaging; Semiconductor device noise; Shift registers; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21810
