IIA-6 analysis of (Al, Ga)As/GaAs MODFET current characteristics at 77 K: Elimination of current collapse, observation of transconductance dip

Author

Fischer, Ray ; Masselink, W. Ted ; Henderson, Tim ; Klem, J. ; Arnold, Dorian ; Morkoc, H.

Volume

Issue

fYear

1984

fDate

12/1/1984 12:00:00 AM

Firstpage

1963

Lastpage

1964

Keywords

Annealing; Current measurement; Electron devices; FETs; Gallium arsenide; HEMTs; Laboratories; MODFETs; Threshold voltage; Transconductance;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

DOI

10.1109/T-ED.1984.21830

Filename

1484115

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