DocumentCode
1095176
Title
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Author
Moran, A. ; LaBel, K. ; Gates, M. ; Seidleck, C. ; McGraw, R. ; Broida, M. ; Firer, J. ; Sprehn, S.
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Volume
43
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
879
Lastpage
885
Abstract
We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored
Keywords
computer testing; coprocessors; integrated circuit testing; ion beam effects; microprocessor chips; proton effects; space vehicle electronics; Intel 80386 family; Intel 80387 coprocessor; Intel 80486 microprocessor; Intel 82380 peripheral device; latchup conditions; single event effect test; single event upset; space radiation effects; spaceflight electronics; Application software; Circuit testing; Clocks; Control systems; Coprocessors; Costs; Manufacturing processes; Microprocessors; Performance evaluation; Single event upset;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.510728
Filename
510728
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