DocumentCode :
1095183
Title :
The carrier-induced index change in AlGaAs and 1.3 µm InGaAsP diode lasers
Author :
Manning, Joanne ; Olshansky, Robert ; Su, Chin Bing
Author_Institution :
GTE Laboratories, Waltham, MA, USA
Volume :
19
Issue :
10
fYear :
1983
fDate :
10/1/1983 12:00:00 AM
Firstpage :
1525
Lastpage :
1530
Abstract :
The carrier-induced index change has been measured for a large number of broad-area AlGaAs and 1.3 μm InGaAsP diode lasers. The observed index change with injected carrier density is -(1.2 \\pm 0.2) \\times 10^{-20} cm3for AlGaAs lasers and -(2.8 \\pm 0.6) \\times 10^{20} cm3for 1.3 μm lasers. The index change at threshold varies from -0.03 to -0.06 for AlGaAs lasers and from -0.04 to -0.10 for InGaAsP lasers. This variation is correlated with the carrier density at threshold, which depends on active layer thickness and doping level. For the first time, the observed index change is compared to the carrier density found from differential carrier lifetime measurements. This accurate determination of the carrier density represents a significant improvement over previous studies.
Keywords :
Aluminum materials/devices; Gallium materials/lasers; Indium materials/devices; Optical refraction; Absorption; Charge carrier density; Charge carrier lifetime; Diode lasers; Doping; Laser modes; Laser transitions; Optical materials; Pulse measurements; Quantum well lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1983.1071749
Filename :
1071749
Link To Document :
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