• DocumentCode
    1095201
  • Title

    SEU and latch-up results on transputers

  • Author

    Bezerra, F. ; Velazco, R. ; Assoum, A. ; Benezech, D.

  • Author_Institution
    CNES, Toulouse, France
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    893
  • Lastpage
    898
  • Abstract
    IMST805 and IMST225 transputers are being considered for space applications. With a view to predict their in orbit behaviour, their sensitivity to Single Event Phenomena has been evaluated under heavy ions
  • Keywords
    aerospace computing; computer testing; integrated circuit testing; ion beam effects; special purpose computers; transputers; IMST225 transputer; IMST805 transputer; SEU; heavy ions; in orbit behaviour; latch-up results; sensitivity; single event phenomena; space applications; Cache memory; Circuit testing; Microprocessors; Production; Random access memory; Read-write memory; Registers; Single event upset; System testing; Test equipment;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.510730
  • Filename
    510730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1095201