Title :
An experimental survey of heavy ion induced dielectric rupture in Actel Field Programmable Gate Arrays (FPGAs)
Author :
Swift, Gary ; Katz, Richard
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
6/1/1996 12:00:00 AM
Abstract :
Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET (linear energy transfer), angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses
Keywords :
failure analysis; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; ion beam effects; space vehicle electronics; Actel FPGAs; angle dependence; bias dependence; cross sections; failure analyses; feature size dependence; field programmable gate arrays; heavy ion induced dielectric rupture; ion LET; single event dielectric rupture; spacecraft uses; temperature dependence; Circuit testing; Conductors; Dielectric devices; Field programmable gate arrays; Frequency; Laboratories; MOSFETs; Propulsion; Space technology; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
