• DocumentCode
    109539
  • Title

    Monitoring Transistor Degradation in Power Inverters Through Pole Shifts

  • Author

    Hayes, James Hunter ; Hubing, Todd H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA
  • Volume
    57
  • Issue
    4
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    764
  • Lastpage
    770
  • Abstract
    In a power inverter configuration with pull-up and pull-down transistors, ringing that occurs on the high-to-low and low-to-high transitions can be used to track aging or degradation of the transistors and potentially predict failures. Changes in a transistor´s equivalent resistance and capacitance can affect the frequency and damping factor of the characteristic ringing detected on the inverter´s output. In this paper, the matrix pencil method is used to locate the poles associated with this ringing, and detect shifts in position that indicate transistor degradation.
  • Keywords
    damping; fault diagnosis; invertors; matrix algebra; power MOSFET; MOSFET; damping factor; equivalent capacitance; equivalent resistance; matrix pencil method; pole shift; power inverter; pull-down transistor; pull-up transistor; transistor degradation monitoring; Current measurement; Degradation; Electrostatic discharges; Inverters; Threshold voltage; Transistors; Voltage measurement; Failure prediction; MOSFETs; matrix pencil method (MPM); power inverters; ringing; transistor degradation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2014.2388081
  • Filename
    7063953