DocumentCode :
109539
Title :
Monitoring Transistor Degradation in Power Inverters Through Pole Shifts
Author :
Hayes, James Hunter ; Hubing, Todd H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC, USA
Volume :
57
Issue :
4
fYear :
2015
fDate :
Aug. 2015
Firstpage :
764
Lastpage :
770
Abstract :
In a power inverter configuration with pull-up and pull-down transistors, ringing that occurs on the high-to-low and low-to-high transitions can be used to track aging or degradation of the transistors and potentially predict failures. Changes in a transistor´s equivalent resistance and capacitance can affect the frequency and damping factor of the characteristic ringing detected on the inverter´s output. In this paper, the matrix pencil method is used to locate the poles associated with this ringing, and detect shifts in position that indicate transistor degradation.
Keywords :
damping; fault diagnosis; invertors; matrix algebra; power MOSFET; MOSFET; damping factor; equivalent capacitance; equivalent resistance; matrix pencil method; pole shift; power inverter; pull-down transistor; pull-up transistor; transistor degradation monitoring; Current measurement; Degradation; Electrostatic discharges; Inverters; Threshold voltage; Transistors; Voltage measurement; Failure prediction; MOSFETs; matrix pencil method (MPM); power inverters; ringing; transistor degradation;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2014.2388081
Filename :
7063953
Link To Document :
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