DocumentCode :
1095416
Title :
On a generalized test sequencing problem
Author :
Pattipati, Krishna R. ; Dontamsetty, Mahesh
Author_Institution :
Dept. of Electr. & Syst. Eng., Connecticut Univ., Storrs, CT, USA
Volume :
22
Issue :
2
fYear :
1992
Firstpage :
392
Lastpage :
396
Abstract :
The primary focus of diagnosis in field maintenance of systems is to identify the faulty modules rather than the individual faults within the modules. In addition, diagnosis is often integrated with two types of repair: type 1 repair wherein a module is repaired after complete diagnosis, and a type 2 repair wherein a module suspected to be faulty is replaced after partial diagnosis. The problem of constructing optimal and suboptimal test sequences to diagnose faults in modular systems with type 1 and type 2 repair options is considered. Dynamic programming recursion for this generalized test sequencing problem is derived, and lower bounds on the optimal cost-to-go based on information theory are derived. These bounds ensure that an optimal test algorithm is found by AND/OR graph heuristic search procedures. It is illustrated how type 2 repair can be profitably combined with diagnosis to reduce the expected test time
Keywords :
dynamic programming; fault location; graph theory; maintenance engineering; modules; AND/OR graph heuristic search procedures; complete diagnosis; dynamic programming; expected test time; faulty modules; field maintenance; generalized test sequencing problem; information theory; modular systems; partial diagnosis; suboptimal test sequences; type 1 repair; type 2 repair; Application software; Costs; Dynamic programming; Fault diagnosis; Information theory; Mechanical systems; Medical diagnosis; Probability distribution; System testing; Systems engineering and theory;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9472
Type :
jour
DOI :
10.1109/21.148415
Filename :
148415
Link To Document :
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