DocumentCode
1095427
Title
IVB-3 surface mobility of holes and electrons in silicon at low temperatures
Author
Kenneth, K.O. ; Cottrell, P.E.
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1976
Lastpage
1976
Keywords
Charge carrier processes; Degradation; Electron mobility; MOSFET circuits; Quantization; Quantum computing; Quantum mechanics; Silicon; Temperature; Very large scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21865
Filename
1484150
Link To Document