DocumentCode
1095464
Title
Data-feedthrough faults in circuits using unclocked storage elements
Author
Al-Assadi, Waleed K. ; Lu, Dan ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO
Volume
30
Issue
10
fYear
1994
fDate
5/12/1994 12:00:00 AM
Firstpage
764
Lastpage
765
Abstract
Some faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate
Keywords
CMOS integrated circuits; asynchronous sequential logic; combinatorial circuits; logic testing; semiconductor storage; behavioural level; circuit faults; combinational behaviour; data-feedthrough faults; stuck-at faults; stuck-at-0/1 faults; unclocked storage elements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19940514
Filename
289213
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