Title :
Effects related to dose deposition profiles in integrated optics structures
Author :
West, R.H. ; Dowling, S.
Author_Institution :
Royal Mil. Coll. of Sci., Cranfield Univ., Swindon, UK
fDate :
6/1/1996 12:00:00 AM
Abstract :
Results from exposures of lithium tantalate and lithium niobate integrated optic structures to pulses of high energy X-rays and fast electrons are related to dose and charge deposition profiles. Anomalous effects in the tantalate are ascribed to induced electric fields
Keywords :
X-ray effects; electron beam effects; integrated optics; lithium compounds; LiNbO3; LiTaO3; anomalous effects; charge deposition profiles; dose deposition profiles; fast electrons; high energy X-rays; induced electric fields; integrated optics structures; Electron optics; Integrated optics; Lithium compounds; Lithium niobate; Optical materials; Optical pulses; Optical refraction; Optical scattering; Optical variables control; X-rays;
Journal_Title :
Nuclear Science, IEEE Transactions on
