Title :
Delay fault propagation in synchronous sequential circuits
Author :
Girard, P. ; Landrault, C. ; Pravossoudovitch, S.
fDate :
5/12/1994 12:00:00 AM
Abstract :
Compared with the propagation of logic errors produced by stuck-at faults, the propagation of gate delay fault effects in sequential circuits poses some particular problems. The authors first describe the propagation conditions of such faults then define the propagation rules of these faults which are used in a new delay fault simulation process for synchronous sequential circuits
Keywords :
delays; logic testing; sequential circuits; delay fault propagation; delay fault simulation process; gate delay fault effects; logic errors; propagation conditions; propagation rules; synchronous sequential circuits;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940538
