SEE data from the APEX Cosmic Ray Upset experiment: predicting the performance of commercial devices in space

Author

Adolphsen, John ; Barth, Janet L. ; Stassinopoulos, E.G. ; Gruner, Timothy ; Wennersten, Miriam ; LaBel, Kenneth A. ; Seidleck, Christina M.

Author_Institution

Unisys, Lanham, MD, USA

Volume

43

Issue

3

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

1069

Lastpage

1076

Abstract

This paper presents additional results from the CRUX experiment on the US Air Force APEX satellite. The experiment monitors single event effects on 256 Kbit and 1 Mbit SRAMs. It is shown that trapped protons dominate the single event upset rates, as evidenced by correlation with measured proton flux peaks and with flux contours calculated with the AP8 model. The responses of some part type lots were surprising because of the wide variation exhibited in upset rates from device to device within a part type, and because of a wide disparity in upset rates, depending on logic state. The use of generic ground test data in error rate predictions for a mission may be acceptable, but may also result in answers whose inaccuracies are unknown and could be unacceptably large

Keywords

SRAM chips; artificial satellites; cosmic ray interactions; integrated circuit modelling; integrated circuit testing; proton effects; space vehicle electronics; 1 Mbit; 256 Kbit; AP8 model; APEX cosmic ray upset experiment; CRUX experiment; SEE data; SRAMs; US Air Force APEX satellite; error rate predictions; flux contours; generic ground test data; logic state; part type lots; proton flux peaks; single event effects; single event upset rates; trapped protons; Aerospace electronics; Error analysis; Extraterrestrial measurements; Orbits; Particle measurements; Protons; Satellites; Single event upset; Space vehicles; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.510757

Filename

510757