Estimating component-defect probability from masked system success/failure data

Author

Reiser, Benjamin ; Flehinger, Betty J. ; Conn, Andrew R.

Author_Institution

IBM Res. Div., Yorktown Heights, NY, USA

Volume

45

Issue

2

fYear

1996

fDate

6/1/1996 12:00:00 AM

Firstpage

238

Lastpage

243

Abstract

Consider a system of k components that fails whenever there is a defect in at least one of the components. Due to cost and time constraints it is not feasible to learn exactly which components are defective. Instead, test procedures ascertain that the defective components belong to some subset of the k components. This phenomenon is termed masking. The authors describe a 2-stage procedure in which a sample of masked subsets is subjected to intensive failure analysis. This enables maximum-likelihood estimation of the defect probability of each individual component and leads to diagnosis of the defective components in future masked failures

Keywords

consecutive system reliability; failure analysis; maximum likelihood estimation; probability; reliability theory; component defect probability estimation; defect probability; intensive failure analysis; k components; masked system success/failure data; maximum-likelihood estimation; test procedures; Ceramics; Costs; Data analysis; Failure analysis; Life estimation; Lifetime estimation; Maximum likelihood estimation; System testing; Time factors; Wires;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.510808

Filename

510808