DocumentCode :
1095692
Title :
Reliability optimization of series-parallel systems using a genetic algorithm
Author :
Coit, David W. ; Smith, Alice E.
Author_Institution :
Rutgers Univ., Piscataway, NJ, USA
Volume :
45
Issue :
2
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
254
Abstract :
A problem-specific genetic algorithm (GA) is developed and demonstrated to analyze series-parallel systems and to determine the optimal design configuration when there are multiple component choices available for each of several k-out-of-n:G subsystems. The problem is to select components and redundancy-levels to optimize some objective function, given system-level constraints on reliability, cost, and/or weight. Previous formulations of the problem have implicit restrictions concerning the type of redundancy allowed, the number of available component choices, and whether mixing of components is allowed. GA is a robust evolutionary optimization search technique with very few restrictions concerning the type or size of the design problem. The solution approach was to solve the dual of a nonlinear optimization problem by using a dynamic penalty function. GA performs very well on two types of problems: (1) redundancy allocation originally proposed by Fyffe, Hines, Lee, and (2) randomly generated problem with more complex k-out-of-n:G configurations.
Keywords :
consecutive system reliability; design engineering; dynamic programming; genetic algorithms; reliability theory; components selection; dynamic penalty function; evolutionary optimization search technique; k-out-of-n:G subsystems; multiple component choices; nonlinear optimization; optimal design configuration; problem-specific genetic algorithm; redundancy allocation; redundancy levels selection; reliability optimization; series-parallel systems; Algorithm design and analysis; Constraint optimization; Consumer electronics; Cost function; Design optimization; Dynamic programming; Genetic algorithms; Lagrangian functions; Redundancy; Robustness;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.510811
Filename :
510811
Link To Document :
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