Title :
VIB-4 Substrate effects on the performance of MESFET´s fabricated on undoped LEC GaAs and In-alloyed GaAs
fDate :
12/1/1984 12:00:00 AM
Keywords :
Automatic testing; Crystals; Etching; FETs; Fabrication; Gallium arsenide; Laboratories; MESFETs; System testing; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21892
