DocumentCode

1095721

Title

VIB-4 Substrate effects on the performance of MESFET´s fabricated on undoped LEC GaAs and In-alloyed GaAs

Author

Lee, R.E.

Volume

31

Issue

12

fYear

1984

fDate

12/1/1984 12:00:00 AM

Firstpage

1987

Lastpage

1987

Keywords

Automatic testing; Crystals; Etching; FETs; Fabrication; Gallium arsenide; Laboratories; MESFETs; System testing; Threshold voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1984.21892

Filename

1484177