Title :
Analysis of satellite on-board time-space-time switching networks with multiple separated space switches
Author :
Kang, Sang Hyuk ; Chun, Min Young ; Sung, Dan Keun
Author_Institution :
Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fDate :
6/1/1996 12:00:00 AM
Abstract :
Advanced satellite on-board baseband switching processors have time-space-time (T-S-T) structures which are similar to the terrestrial switching networks (Sw-Nw). Generally, the satellite systems require higher reliability than ground equipment because of more severe environment and lack of repair. This paper proposes fault-tolerant satellite on-board T-S-T Sw-Nw with multiple separated space switches instead of a single spare switch. The authors analyze the mean time to unreliable operation (MTUO), as a performance and reliability index for the T-S-T systems with multiple separated space switches as well as conventional T-S-T systems. The MTUO varies depending on the threshold level of blocking-probability and the offered traffic. In general, T-S-T Sw-Nw with multiple space switches have better performance and reliability than those with the single space switch, and their performabilities are appreciably improved, especially for one additional spare space switch. This study can be extended to analyze the performance and reliability of entire satellite communication systems including the on-board baseband Sw-Nw, Rx interfaces, and Tx interfaces
Keywords :
electronic switching systems; satellite communication; switching networks; telecommunication network reliability; blocking-probability; fault-tolerant systems; mean time to unreliable operation; multiple separated space switches; multiple space switches; on-board baseband switching processors; performance; reliability; reliability index; satellite on-board time-space-time switching networks; time-space-time structures; Baseband; Communication switching; Degradation; Fault tolerance; Performance analysis; Satellite communication; Space technology; Switches; Telecommunication network reliability; Transponders;
Journal_Title :
Reliability, IEEE Transactions on