DocumentCode :
1095899
Title :
Cryogenic charge-sensitive preamplifiers, for high dynamic range and fast speed of response using GaAs technology
Author :
Camin, D.V. ; Pessina, G. ; Previtali, E.
Author_Institution :
Dipartimento di Fisica, Milan Univ., Italy
Volume :
38
Issue :
2
fYear :
1991
fDate :
4/1/1991 12:00:00 AM
Firstpage :
53
Lastpage :
57
Abstract :
Charge-sensitive preamplifiers using GaAs MESFETs have been designed to satisfy requirements of high dynamic range, low power dissipation, and low noise at short shaping times. They use SGM20006M MESFETs, a replacement type for the 3SK164. The main parameters of the preamplifiers with a detector capacitance of 400 pF are an equivalent noise charge (ENC) of 5500 RMS electrons at 77 K at 100-μs Gaussian shaping time, an input resistance of 22 Ω, and a power dissipation of 52 mW with 0.2% integral nonlinearity and 2-V output. Radiation damage tests have been performed showing a fairly high ENC insensitivity to 1014n/cm2 neutron fluence, particularly at short shaping time. Ionizing radiation increases the ENC by a factor of 2 when the dose is 10 Mrad(Si)
Keywords :
III-V semiconductors; Schottky gate field effect transistors; cryogenics; gallium arsenide; nuclear electronics; preamplifiers; 100 mus; 1E7 rad; 3SK164; 400 pF; 52 mW; 77 K; GaAs; Gaussian shaping time; MESFET; SGM20006M; charge-sensitive preamplifiers; cryogenic preamplifiers; damage tests; detector capacitance; equivalent noise charge; high dynamic range; input resistance; integral nonlinearity; low noise; low power dissipation; short shaping times; Capacitance; Cryogenics; Detectors; Dynamic range; Gallium arsenide; Gaussian noise; MESFETs; Noise shaping; Power dissipation; Preamplifiers;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.289262
Filename :
289262
Link To Document :
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