Title :
Comparison of reduced-order interconnect macromodels for time-domain simulation
Author :
Palenius, Timo ; Roos, Janne
Author_Institution :
Dept. of Electr. & Commun. Eng., Helsinki Univ. of Technol., Espoo, Finland
Abstract :
A typical integrated-circuit model consists of nonlinear transistor models and large linear RLC networks describing the interconnects. During the last decade, various model-reduction algorithms have been developed for replacing each RLC network with an approximately equivalent, but much smaller, model. Since these reduced-order models are described in the frequency domain, they have to be linked to the transient analysis of the whole nonlinear circuit, which can be done by replacing these models with appropriate macromodels. In the interconnect literature, the actual macromodel realization, which has a great impact on the transient-simulation CPU time, is often overlooked. This paper presents a comprehensive comparison of nine reduced-order interconnect macromodels for time-domain simulation: the macromodels are reviewed, presented in a unified manner, and compared both theoretically and numerically. Since we have implemented all the nine macromodels into the APLAC circuit simulation and design tool, we are able to present a fair and meaningful CPU-time comparison.
Keywords :
RLC circuits; circuit simulation; equivalent circuits; frequency-domain analysis; integrated circuit interconnections; integrated circuit modelling; reduced order systems; time-domain analysis; transient analysis; frequency domain; integrated circuit interconnection; integrated-circuit model; linear RLC networks; nonlinear circuit; nonlinear transistor models; reduced-order interconnect macromodels; time-domain simulation; transient analysis; transient-simulation CPU time; Analytical models; Circuit simulation; Frequency domain analysis; Integrated circuit interconnections; Nonlinear circuits; RLC circuits; Reduced order systems; Time domain analysis; Transient analysis; Very large scale integration; Interconnect simulation; macromodeling; model-order reduction; transient analysis;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.834562