• DocumentCode
    1096136
  • Title

    Phase noise and spectral line shape in semiconductor lasers

  • Author

    Daino, B. ; Spano, P. ; Tamburrini, M. ; Piazzolla, S.

  • Author_Institution
    Fondazione Ugo Bordoni, Rome, Italy
  • Volume
    19
  • Issue
    3
  • fYear
    1983
  • fDate
    3/1/1983 12:00:00 AM
  • Firstpage
    266
  • Lastpage
    270
  • Abstract
    Experimental results concerning the study of phase noise in single-mode semiconductor lasers are reported, which show a strict connection between phase and intensity noise. In particular, phase-noise spectrum is found to present a sharp peak at the same peak frequency of intensity-noise spectrum, a fact which is proven to be responsible for the appearance of satellite peaks in the emission line shape. Direct measurements of the line shape, performed by means of a Fabry-Perot interferometer, are in agreement with the line shape evaluated by using phase-noise spectrum measurements.
  • Keywords
    Gallium materials/lasers; Laser noise; Semiconductor lasers; Frequency; Laser noise; Noise shaping; Performance evaluation; Phase measurement; Phase noise; Satellites; Semiconductor device noise; Semiconductor lasers; Shape measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1983.1071842
  • Filename
    1071842