• DocumentCode
    1096238
  • Title

    An n-channel MOSFET with Schottky source and drain

  • Author

    Mochizuki, T. ; Wise, K.D.

  • Author_Institution
    University of Michigan, Ann Arbor, MI
  • Volume
    5
  • Issue
    4
  • fYear
    1984
  • fDate
    4/1/1984 12:00:00 AM
  • Firstpage
    108
  • Lastpage
    111
  • Abstract
    An n-channel MOSFET with Schottky source and drain (SBMOSFET) has been successfully fabricated using tantalum for the Schottky electrodes. For long gatelengths (100 µm), there are no significant differences in the characteristics of these SBMOSFET´s compared to those of conventional MOSFET´s. A significant current reduction is observed in SBMOSFET´s having 10-µm gatelengths, however, due to the barrier between source and channel. In spite of the substantial barrier height (0.7 V) between tantalum and p-silicon, still larger barriers and a reduction in the isolation gap between source and channel are desirable for high-drive-high-speed device operation.
  • Keywords
    Current measurement; Etching; Laboratories; MOSFET circuits; Plasma measurements; Schottky diodes; Silicides; Silicon; Solid state circuits; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25850
  • Filename
    1484226