DocumentCode
1096238
Title
An n-channel MOSFET with Schottky source and drain
Author
Mochizuki, T. ; Wise, K.D.
Author_Institution
University of Michigan, Ann Arbor, MI
Volume
5
Issue
4
fYear
1984
fDate
4/1/1984 12:00:00 AM
Firstpage
108
Lastpage
111
Abstract
An n-channel MOSFET with Schottky source and drain (SBMOSFET) has been successfully fabricated using tantalum for the Schottky electrodes. For long gatelengths (100 µm), there are no significant differences in the characteristics of these SBMOSFET´s compared to those of conventional MOSFET´s. A significant current reduction is observed in SBMOSFET´s having 10-µm gatelengths, however, due to the barrier between source and channel. In spite of the substantial barrier height (0.7 V) between tantalum and p-silicon, still larger barriers and a reduction in the isolation gap between source and channel are desirable for high-drive-high-speed device operation.
Keywords
Current measurement; Etching; Laboratories; MOSFET circuits; Plasma measurements; Schottky diodes; Silicides; Silicon; Solid state circuits; Substrates;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.25850
Filename
1484226
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