Title :
Static random access memory using high electron mobility transistors
Author :
Lee, S.J. ; Lee, C.P. ; Hou, D.L. ; Anderson, R.J. ; Miller, D.L.
Author_Institution :
Rockwell International, Thousanda Oaks, CA
fDate :
4/1/1984 12:00:00 AM
Abstract :
A 4-bit fully decoded static random access memory (RAM) has been designed and fabricated using high electron mobility transistors (HEMT´s) with a direct-coupled FET logic approach. The circuit incorporates approximately 50 logic gates. A fully operating memory circuit was demonstrated with an access time of 1.1 ns and a minimum WRITE-enable pulse of less than 2-ns duration at room temperature. This memory consumes a total power of 14.89 mW and 87.8 µW per memory cell.
Keywords :
Decoding; FETs; HEMTs; Logic circuits; Logic design; Logic gates; MODFETs; Random access memory; Read-write memory; SRAM chips;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1984.25852