Title : 
Static random access memory using high electron mobility transistors
         
        
            Author : 
Lee, S.J. ; Lee, C.P. ; Hou, D.L. ; Anderson, R.J. ; Miller, D.L.
         
        
            Author_Institution : 
Rockwell International, Thousanda Oaks, CA
         
        
        
        
        
            fDate : 
4/1/1984 12:00:00 AM
         
        
        
        
            Abstract : 
A 4-bit fully decoded static random access memory (RAM) has been designed and fabricated using high electron mobility transistors (HEMT´s) with a direct-coupled FET logic approach. The circuit incorporates approximately 50 logic gates. A fully operating memory circuit was demonstrated with an access time of 1.1 ns and a minimum WRITE-enable pulse of less than 2-ns duration at room temperature. This memory consumes a total power of 14.89 mW and 87.8 µW per memory cell.
         
        
            Keywords : 
Decoding; FETs; HEMTs; Logic circuits; Logic design; Logic gates; MODFETs; Random access memory; Read-write memory; SRAM chips;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/EDL.1984.25852