• DocumentCode
    1096288
  • Title

    Bias dependence of capacitances in modulation-doped FET´s at 4 GHz

  • Author

    Arnold, D. ; Kopp, W. ; Fischer, R. ; Klem, J. ; Morkoc, H.

  • Author_Institution
    University of Illinois, Urbana, Illinois
  • Volume
    5
  • Issue
    4
  • fYear
    1984
  • fDate
    4/1/1984 12:00:00 AM
  • Firstpage
    123
  • Lastpage
    125
  • Abstract
    Scattering-parameter measurements were made on 1.0- µm gate normally-on and 1.6-µm gate normally-off modulation-doped field-effect transistors (MOD/FET´s) as a function of bias at 4 GHz. A maximum oscillation frequency of 38 GHz, which is about 8 GHz larger than that for a comparable GaAs MESFET, due to larger transconductances for the MODFET´s, was obtained. The input capacitance was found to vary more than expected with gate bias, while the feedback capacitance was nearly independent of bias in the saturation regime. Output capacitance increases as Vgsapproached the pinchoff voltage. These results should be of great importance in large-signal modeling of integrated circuits based on modulation-doped FET´s.
  • Keywords
    Capacitance; Epitaxial layers; FETs; Frequency; Gallium arsenide; HEMTs; Integrated circuit modeling; MESFETs; MODFETs; Scattering;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25855
  • Filename
    1484231