• DocumentCode
    1096307
  • Title

    Studies of performance and resolution of double sided silicon strip detectors

  • Author

    Alexander, J.P. ; Artuso, M. ; Busch, B. ; Dobbins, J. ; Jones, C.D. ; Wuerthwein, F. ; Morrison, R.J. ; Schmidt, D.M.

  • Author_Institution
    Dept. of Phys., Cornell Univ., Ithaca, NY, USA
  • Volume
    38
  • Issue
    2
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    263
  • Lastpage
    268
  • Abstract
    Double-sided silicon strip detectors have been fabricated and tested in a silicon tracking telescope placed in a high-energy muon beam at Fermi National Accelerator Laboratory. The detectors feature AC coupling to front-end electronics and employ two different techniques for isolating n-strips. The CAMEX 64-channel multiplexing amplifier is used for readout. Preliminary results of measurements are reported on pulse heights, signal-to-noise performance, hit resolution, and impedance characteristics of the detector. Measurements of the bias resistance illustrate a mild dependence on bias voltage and, for the field-effect detectors, a strong dependence on the voltage of the readout strips and field strips. The signal-to-noise ratio is determined to be in the range of 10-12, but is expected to increase with improvements to the electronics
  • Keywords
    muon detection and measurement; nuclear electronics; particle beam diagnostics; position sensitive particle detectors; semiconductor counters; AC coupling; CAMEX 64-channel multiplexing amplifier; Fermi National Accelerator Laboratory; Si detector; bias resistance; bias voltage; double sided; field-effect detectors; front-end electronics; high-energy muon beam; hit resolution; impedance characteristics; n-strips; pulse heights; readout strips; signal-to-noise performance; strip detectors; tracking telescope; Detectors; Electrical resistance measurement; Mesons; Pulse amplifiers; Pulse measurements; Silicon; Strips; Telescopes; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.289307
  • Filename
    289307