Title :
Analytical and numerical analyses of the delay time of BiCMOS structures
Author :
Rofail, Samir S. ; Elmasry, Mohamed I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fDate :
5/1/1992 12:00:00 AM
Abstract :
Analytical expressions for the transient response of BiCMOS structures have been derived. The analysis is performed on conventional structures and structures employing short-channel MOSFETs. The equations relate the delay time to key device and technology parameters. In deriving the time response, the two basic conduction regions (linear and saturation) for the MOSFET have been considered. A numerical algorithm for solving for the delay time of BiCMOS structures taking into account high-level injection effects, base resistance, doping-dependent mobilities, and bandgap narrowing is presented. A figure of merit for the speed is derived and scaling the supply voltage is considered
Keywords :
BIMOS integrated circuits; delays; semiconductor device models; transient response; BiCMOS structures; bandgap narrowing; base resistance; delay time; doping-dependent mobilities; high-level injection effects; linear conduction region; numerical algorithm; saturation conduction region; short-channel MOSFETs; supply voltage scaling; transient response; BiCMOS integrated circuits; Delay effects; Equations; MOSFETs; Numerical analysis; Performance analysis; Photonic band gap; Time factors; Transient response; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of