• DocumentCode
    1096619
  • Title

    MMV: A Metamodeling Based Microprocessor Validation Environment

  • Author

    Mathaikutty, Deepak A. ; Kodakara, Sreekumar V. ; Dingankar, Ajit ; Shukla, Sandeep K. ; Lilja, David J.

  • Author_Institution
    Virginia Polytech. Inst. & State Univ., Blacksburg
  • Volume
    16
  • Issue
    4
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    339
  • Lastpage
    352
  • Abstract
    With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validation challenges. The systematic validation approach starts with defining the correct behaviors of the hardware and software components and their interactions. This requires new modeling paradigms that support multiple levels of abstraction. Mutual consistency of models at adjacent levels of abstraction is crucial for manual refinement of models from the full chip level to production register transfer level, which is likely to remain the dominant design methodology of complex microprocessors in the near future. In this paper, we present microprocessor modeling and validation environment (MMV), a validation environment based on metamodeling, that can be used to create models at various abstraction levels and to generate most of the important validation collaterals, viz., simulators, checkers, coverage, and test generation tools. We illustrate the functionalities in MMV by modeling a 32-bit reduced instruction set computer processor at the system, instruction set architecture, and microarchitecture levels. We show by examples how consistency across levels is enforced during modeling and also how to generate constraints for automatic test generation.
  • Keywords
    automatic test pattern generation; microprocessor chips; automatic test generation; computer processor system; microprocessor modeling and validation environment; multiple microprocessing core; systematic validation approach; Architectural description language; metamodel; metamodeling; microprocessor; model-driven design and validation; refinement; validation collaterals;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.917419
  • Filename
    4469915