DocumentCode :
1096722
Title :
Self-alignment processed amorphous silicon ring oscillators
Author :
Hiranaka, K. ; Yamaguchi, T. ; Yanagisawa, S.
Author_Institution :
Fijitsu Laboratories, Ltd., Atsugi, Japan
Volume :
5
Issue :
7
fYear :
1984
fDate :
7/1/1984 12:00:00 AM
Firstpage :
224
Lastpage :
225
Abstract :
Amorphous silicon field-effect transistors (a-Si FET´s) have been integrated into eleven-stage ring oscillators. The inverter consists of an n-channel driver a-Si FET and an n+ a-Si load resistor. a-Si FET´s were fabricated by the self-alignment process. Ring oscillators with a gate length of 5 µm and a gate width of 120 µm achieved a propagation delay time of 210 ns, the lowest reported to date. Those with a length and width of 5 and 1200 µm, respectively, achieved 540 ns. These propagation delay times are about two orders of magnitude faster than those attained previously.
Keywords :
Amorphous silicon; Electrodes; FETs; Fabrication; Glass; Inverters; Logic circuits; Propagation delay; Resistors; Ring oscillators;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1984.25897
Filename :
1484273
Link To Document :
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