Title :
Study of the effective grain boundary recombination velocity under different injection levels
Author :
De Pauw, P. ; Mertens, R. ; Van Overstraeten, R. ; Leuven, K.U.
Author_Institution :
MIETEC, Antwerpen, Belgium
fDate :
7/1/1984 12:00:00 AM
Abstract :
The recombination activity of a grain boundary, is usually expressed by an effective recombination velocity seffdefined at the grain boundary depletion layer edge. While theory shows that seffdecreases with increasing injection levels, experiments however could not clearly confirm this theoretical expectation. In this letter a new method to measure seffas a function of the injection level is proposed. Using this method, strong direct experimental evidence for a decreasing seffwith the injection level is given.
Keywords :
Conductivity; Current measurement; Grain boundaries; Helium; Integrated circuit measurements; Laboratories; Photovoltaic cells; Silicon; Space charge; Spontaneous emission;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1984.25901