• DocumentCode
    1096781
  • Title

    Control of threshold voltage of AlGaAs/GaAs 2DEG FET´s through heat treatment

  • Author

    Takanashi, Y. ; Hirano, M. ; Sugeta, T.

  • Author_Institution
    N.T.T., Kanagawa, Japan
  • Volume
    5
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    241
  • Lastpage
    243
  • Abstract
    Threshold voltage controls of Ni/Ti/Au gate and Ti/Au gate 2DEG AlGaAs/GaAs FET´s through only heat treatment are investigated. Ni/Ti/Au gate FET´s vary over quite a wide range from a depletion mode to an enhancement mode without degradation of FET characteristics after heat treatment at 300°C. The same experiment is made for Ti/Au gate FET´s, but the threshold voltage change is negligibly small. It is confirmed that Ni/Ti/Au can be used as the gate metal for E-FET and Ti/Au as the gate metal for D-FET under simultaneous heat treatment. In addition, a mechanism for penetrating the barrier metal into the underlying layer is discussed.
  • Keywords
    Electron mobility; FETs; Gallium arsenide; Gold; Heat treatment; Molecular beam epitaxial growth; Temperature control; Thickness control; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25903
  • Filename
    1484279