• DocumentCode
    1096878
  • Title

    Two-dimensional numerical analysis of the high electron mobility transistor

  • Author

    Widiger, D. ; Hess, K. ; Coleman, J.J.

  • Author_Institution
    University of Illinois, Urbana, IL
  • Volume
    5
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    266
  • Lastpage
    269
  • Abstract
    We develop a two-dimensional model for the high electron mobility transistor (HEMT) including conduction outside the quantum well. The model uses the continuity and power balance moment equations for both inside and outside the well, with electron concentration and average energy as dependent variables, and with parameters determined by Monte Carlo simulation. We show that conduction outside the well is dominant in the "pinchoff" region and that consequently the speed advantage of the HEMT over conventional devices does not arise from high saturation velocities in the quantum well but rather from a lower access resistance as suggested by a velocity profile calculation. It is further demonstrated that several effects which are unimportant in conventional FET\´s are of significance in the HEMT. Among these effects are electronic heat conduction and to some extent real space transfer.
  • Keywords
    Degradation; Electron mobility; FETs; HEMTs; Impurities; MODFETs; Molecular beam epitaxial growth; Numerical analysis; Particle scattering; Space heating;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25913
  • Filename
    1484289