Title :
Subpicosecond electrical sampling
Author :
Valdmanis, Janis A. ; Mourou, Gerard A. ; Gabel, C.W.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fDate :
4/1/1983 12:00:00 AM
Abstract :
We report on the recent advances of an electrooptic sampling technique for the characterization of electrical transients that has now achieved an unprecedented temporal resolution of less than 1 ps. Voltage sensitivity is on the order of 50 μV. A lithium tantalate traveling wave Pockels cell is employed in conjunction with a high repetition rate subpicosecond laser system.
Keywords :
Electromagnetic (EM) measurements; Electromagnetic (EM) transient analysis; Laser applications, measurement; Photoconducting materials/devices; Pockels effect; Pulse measurement; Signal sampling/reconstruction; Electric variables measurement; Laser modes; Lasers and electrooptics; Optical pulses; Optical sensors; Ring lasers; Sampling methods; Signal resolution; Ultrafast optics; Voltage;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1983.1071915
