DocumentCode :
1097045
Title :
GaAs/(Ga,Al)As heterojunction bipolar transistors with buried oxygen-implanted isolation layers
Author :
Asbeck, P.M. ; Miller, D.L. ; Anderson, R.J. ; Eisen, F.H.
Author_Institution :
Rockwell International, Thousand Oaks, CA
Volume :
5
Issue :
8
fYear :
1984
fDate :
8/1/1984 12:00:00 AM
Firstpage :
310
Lastpage :
312
Abstract :
A simple self-aligned technique using oxygen implants to reduce the extrinsic base-collector capacitance in GaAs/(Ga,Al)As heterojunction bipolar transistors (HBT´s) is described. This technique has been used to achieve nonthreshold logic ring-oscillators with propagation delays down to 30 ps per gate, the lowest reported to date for any bipolar transistor circuit.
Keywords :
Annealing; Boron alloys; Capacitance; Diodes; Etching; Fabrication; Gallium arsenide; Heterojunction bipolar transistors; Implants; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1984.25927
Filename :
1484303
Link To Document :
بازگشت