DocumentCode
1097312
Title
A GaAs gate heterojunction FET
Author
Solomon, P.M. ; Knoedler, C.M. ; Wright, S.L.
Author_Institution
IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Volume
5
Issue
9
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
379
Lastpage
381
Abstract
A new semiconductor-insulator-semiconductor field-effect transistor has been fabricated. The device consists of a heavily doped n-type GaAs gate with undoped (Al,Ga)As as the gate insulator, on an undoped GaAs layer. This structure gives the device a natural threshold voltage near zero, well suited for low-voltage logic. The threshold voltage is, to first order, independent of Al mole fraction and thickness of the (Al,Ga)As layer. The layers were grown by MBE and devices fabricated using a self-aligned technique involving ion-implantation and rapid thermal annealing. A transconductance of 240 mS/mm and a field-effect mobility of about 100 000 cm2/V-s were achieved at 77 K.
Keywords
Doping; Electrons; FETs; Gallium arsenide; HEMTs; Heterojunctions; MODFET circuits; MOSFET circuits; Threshold voltage; Voltage control;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.25953
Filename
1484329
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